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dc.contributor.authorArslan, Şuayb Şefik
dc.contributor.authorPeng, James
dc.contributor.authorGöker, Turguy
dc.date.accessioned2019-12-06T14:58:07Z
dc.date.available2019-12-06T14:58:07Z
dc.date.issued2020en_US
dc.identifier.citationArslan, S. S., Peng, J., & Göker, T. (April 01, 2020). A data-assisted reliability model for carrier-assisted cold data storage systems. Reliability Engineering & System Safety, 196. DOI: 10.1016/j.ress.2019.106708en_US
dc.identifier.issn0951-8320
dc.identifier.urihttps://doi.org/10.1016/j.ress.2019.106708
dc.identifier.urihttps://hdl.handle.net/20.500.11779/1252
dc.description.abstractCold data storage systems are used to allow long term digital preservation for institutions’ archive. The common functionality among cold and warm/hot data storage is that the data is stored on some physical medium for read-back at a later time. However in cold storage, write and read operations are not necessarily done in the same exact geographical location. Hence, a third party assistance is typically utilized to bring together the medium and the drive. On the other hand, the reliability modeling of such a decomposed system poses few challenges that do not necessarily exist in other warm/hot storage alternatives such as fault detection and absence of the carrier, all totaling up to the data unavailability issues. In this paper, we propose a generalized non-homogenous Markov model that encompasses the aging of the carriers in order to address the requirements of today's cold data storage systems in which the data is encoded and spread across multiple nodes for the long-term data retention. We have derived useful lower/upper bounds on the overall system availability. Furthermore, the collected field data is used to estimate parameters of a Weibull distribution to accurately predict the lifetime of the carriers in an example scale-out setting.en_US
dc.language.isoengen_US
dc.publisherElsevieren_US
dc.relation.ispartofReliability Engineering and System Safetyen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCold data storageen_US
dc.subjectNon-homogenousen_US
dc.subjectMarkov modelen_US
dc.subjectReliabilityen_US
dc.subjectAvailabilityen_US
dc.subjectSimulationen_US
dc.subjectAgingArchiveen_US
dc.titleA data-assisted reliability model for carrier-assisted cold data storage systemsen_US
dc.typearticleen_US
dc.departmentMühendislik Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.authoridŞuayb Şefik Arslan / 0000-0003-3779-0731en_US
dc.authoridŞuayb Şefik Arslan / K-2883-2015en_US
dc.identifier.volume196en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.description.wosidWOS:000515213900001en_US
dc.description.scopusid2-s2.0-85075104987en_US
dc.contributor.institutionauthorArslan, Şuayb Şefik
dc.description.woscitationindexScience Citation Index Expandeden_US
dc.identifier.wosqualityQ1en_US
dc.description.WoSDocumentTypeArticleen_US
dc.description.WoSInternationalCollaborationUluslararası işbirliği ile yapılan - EVETen_US
dc.description.WoSPublishedMonthNisanen_US
dc.description.WoSIndexDate2020en_US
dc.description.WoSYOKperiodYÖK - 2019-20en_US
dc.identifier.doi10.1016/j.ress.2019.106708en_US
dc.identifier.scopusqualityQ1en_US


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